Pattern Recognition Lab featured on the Cover of the Journal of Microscopy
Mareike Thies’ work “Calibration by differentiation – Self-supervised calibration for X-ray microscopy using a differentiable cone-beam reconstruction operator” was featured on the cover of the August 2022 Issue of the Journal of Microscopy.
The work features a novel approach to X-ray CT calibration using differentiable back-projection to calibrate an X-ray microscope using known operators. With this technique, supervised and unsupervised calibration using the imaged specimen is possible. This approach enables a fast and simple approach to general X-ray system calibration.
The research leading to these results has received funding from the European Union’s Horizon 2020 Research and Innovation program (Grant agreement No. 720964) as well as from the European Research Council (ERC) (Grant agreement No. 810316). We further thank our collaborators at the Institute for Nanotechnology and Correlative Microscopy e.V. INAM, Forchheim, the Fraunhofer Institute for Ceramic Technologies and Systems IKTS,Forchheim, the Department of Internal Medicine 3, Rheumatology and Immunology, Friedrich-Alexander-Universität Erlangen-Nürnber, the Universitätsklinikum Erlangen, Erlangen, the Leibniz Institute for Analytical Sciences ISAS, Dortmund, the German Center for Immunotherapy, Friedrich-Alexander-Universität Erlangen-Nürnberg and the Physics Department, Freie Universität Berlin
Front Cover: https://onlinelibrary.wiley.com/doi/epdf/10.1111/jmi.13028
Article: https://onlinelibrary.wiley.com/doi/10.1111/jmi.13125