Sani Shaon: Pre-processing and synthetic data generation techniques for defect detection in SiC and AlN wafers [MT Intro] 13 - 20 Mar 10:00 am - 11:30 am
Kirti Jha: Artificial Data Generation and OCR Processing for Improved Analysis of Jewish Gravestone Inscriptions [MT Intro] 13 Mar 10:00 am - 11:30 pm Hybrid Zoom + Seminar Room